Ding Jingfeng, Tao Chunkan, Yan Zhonggen. Detecting Critical Points Based on Baysion Distance. In H. John Caulfield, Shu-Heng Chen, Heng-Da Cheng, Richard J. Duro, Vasant Honavar, Etienne E. Kerre, Mi Lu, Manuel Grana Romay, Timothy K. Shih, Dan Ventura, Paul P. Wang, Yuanyuan Yang, editors, Proceedings of the 6th Joint Conference on Information Science, March 8-13, 2002, Research Triangle Park, North Carolina, USA. pages 863-866, JCIS / Association for Intelligent Machinery, Inc., 2002.
Abstract is missing.