Memristor models and circuits for controlling Process-VDD-Temperature variations

Kwan-Hee Jo, Chul-Moon Jung, Kyeong-Sik Min. Memristor models and circuits for controlling Process-VDD-Temperature variations. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 283-286, IEEE, 2011. [doi]

Abstract

Abstract is missing.