Youngmin Jo, Anil Kavala, Tongsung Kim, Byung-Kwan Chun, Jungjune Park, Taesung Lee, Jungmin Seo, Manjae Yang, Taehyeon Park, Hyunjin Kwon, Cheolhui Lee, Younghoon Son, Junghwan Kwak, Younggyu Lee, Hwan-Seok Ku, Dae-Hoon Na, Changyeon Yu, Jonghoon Park, Jae-Hwan Kim, Hyojin Kwon, Chan Ho Kim, Moon Ki Jung, Chanjin Park, Donghyun Seo, Moosung Kim, Seungjae Lee, Jin-yub Lee, Dongku Kang, Chiweon Yoon, Sunghoi Hur. th generation F-chip with Toggle 5.0 Specification for 16Tb NAND Flash Memory Multi chip Package. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{JoKKCPLSYPKLSKL23,
title = {th generation F-chip with Toggle 5.0 Specification for 16Tb NAND Flash Memory Multi chip Package},
author = {Youngmin Jo and Anil Kavala and Tongsung Kim and Byung-Kwan Chun and Jungjune Park and Taesung Lee and Jungmin Seo and Manjae Yang and Taehyeon Park and Hyunjin Kwon and Cheolhui Lee and Younghoon Son and Junghwan Kwak and Younggyu Lee and Hwan-Seok Ku and Dae-Hoon Na and Changyeon Yu and Jonghoon Park and Jae-Hwan Kim and Hyojin Kwon and Chan Ho Kim and Moon Ki Jung and Chanjin Park and Donghyun Seo and Moosung Kim and Seungjae Lee and Jin-yub Lee and Dongku Kang and Chiweon Yoon and Sunghoi Hur},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185391},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185391},
researchr = {https://researchr.org/publication/JoKKCPLSYPKLSKL23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}