Markov Model-Based Reliability Analysis Considering the Redundancy Effect of Modular Converters

Jae-Seong Jo, Sun-Pil Kim, Seok-Gyu Oh, Tae-Jin Kim, Feel-soon Kang, Sung-Jun Park. Markov Model-Based Reliability Analysis Considering the Redundancy Effect of Modular Converters. IEEE Access, 12:3328-3338, 2024. [doi]

Abstract

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