Arlene John, Salim Ullah, Akash Kumar 0001, Barry Cardiff, Deepu John. An Approximate Binary Classifier for Data Integrity Assessment in IoT Sensors. In 27th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2020, Glasgow, Scotland, UK, November 23-25, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.