John C. Johnson. Options for High-Volume Test of Multi-GB/s Ports. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1435, IEEE, 2004. [doi]
@inproceedings{Johnson04:2,
title = {Options for High-Volume Test of Multi-GB/s Ports},
author = {John C. Johnson},
year = {2004},
doi = {10.1109/ITC.2004.136},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.136},
tags = {testing, C++},
researchr = {https://researchr.org/publication/Johnson04%3A2},
cites = {0},
citedby = {0},
pages = {1435},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}