Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge. Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-8, IEEE, 2016. [doi]
Abstract is missing.