Analyzing Surface Defects in Apples Using Gabor Features

Puneet Jolly, Sundaresan Raman. Analyzing Surface Defects in Apples Using Gabor Features. In Kokou YĆ©tongnon, Albert Dipanda, Richard Chbeir, Giuseppe De Pietro, Luigi Gallo, editors, 12th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2016, Naples, Italy, November 28 - December 1, 2016. pages 178-185, IEEE Computer Society, 2016. [doi]

@inproceedings{JollyR16,
  title = {Analyzing Surface Defects in Apples Using Gabor Features},
  author = {Puneet Jolly and Sundaresan Raman},
  year = {2016},
  doi = {10.1109/SITIS.2016.36},
  url = {http://dx.doi.org/10.1109/SITIS.2016.36},
  researchr = {https://researchr.org/publication/JollyR16},
  cites = {0},
  citedby = {0},
  pages = {178-185},
  booktitle = {12th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2016, Naples, Italy, November 28 - December 1, 2016},
  editor = {Kokou YĆ©tongnon and Albert Dipanda and Richard Chbeir and Giuseppe De Pietro and Luigi Gallo},
  publisher = {IEEE Computer Society},
  isbn = {978-1-5090-5698-9},
}