Puneet Jolly, Sundaresan Raman. Analyzing Surface Defects in Apples Using Gabor Features. In Kokou YĆ©tongnon, Albert Dipanda, Richard Chbeir, Giuseppe De Pietro, Luigi Gallo, editors, 12th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2016, Naples, Italy, November 28 - December 1, 2016. pages 178-185, IEEE Computer Society, 2016. [doi]
@inproceedings{JollyR16, title = {Analyzing Surface Defects in Apples Using Gabor Features}, author = {Puneet Jolly and Sundaresan Raman}, year = {2016}, doi = {10.1109/SITIS.2016.36}, url = {http://dx.doi.org/10.1109/SITIS.2016.36}, researchr = {https://researchr.org/publication/JollyR16}, cites = {0}, citedby = {0}, pages = {178-185}, booktitle = {12th International Conference on Signal-Image Technology & Internet-Based Systems, SITIS 2016, Naples, Italy, November 28 - December 1, 2016}, editor = {Kokou YĆ©tongnon and Albert Dipanda and Richard Chbeir and Giuseppe De Pietro and Luigi Gallo}, publisher = {IEEE Computer Society}, isbn = {978-1-5090-5698-9}, }