Wen-Ben Jone, Sunil R. Das. CACOP - A Random Pattern Testability Analyzer. In VLSI Design. pages 61-64, 1993.
@inproceedings{JoneD93,
title = {CACOP - A Random Pattern Testability Analyzer},
author = {Wen-Ben Jone and Sunil R. Das},
year = {1993},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/JoneD93},
cites = {0},
citedby = {0},
pages = {61-64},
booktitle = {VLSI Design},
}