Wen-Ben Jone, Christos A. Papachristou, M. Pereira. A Scheme for Overlaying Concurrent Testing of VLSI Circuits. In DAC. pages 531-536, 1989. [doi]
@inproceedings{JonePP89,
title = {A Scheme for Overlaying Concurrent Testing of VLSI Circuits},
author = {Wen-Ben Jone and Christos A. Papachristou and M. Pereira},
year = {1989},
doi = {10.1145/74382.74471},
url = {http://doi.acm.org/10.1145/74382.74471},
tags = {testing},
researchr = {https://researchr.org/publication/JonePP89},
cites = {0},
citedby = {0},
pages = {531-536},
booktitle = {DAC},
}