Frans de Jong. SCITT: Back to Basics in Mass Production Testing. In Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999. pages 1138, IEEE Computer Society, 1999.
@inproceedings{Jong99:0,
title = {SCITT: Back to Basics in Mass Production Testing},
author = {Frans de Jong},
year = {1999},
tags = {testing},
researchr = {https://researchr.org/publication/Jong99%3A0},
cites = {0},
citedby = {0},
pages = {1138},
booktitle = {Proceedings IEEE International Test Conference 1999, Atlantic City, NJ, USA, 27-30 September 1999},
publisher = {IEEE Computer Society},
}