Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System

Young Bok Joo, Chan-Ho Han, Kil-Houm Park. Robust Defect Size Measurement Using 3D Modeling for LCD Defect Detection in Automatic Vision Inspection System. IEICE Transactions, 93-C(6):922-928, 2010. [doi]

Abstract

Abstract is missing.