Hamed Jooypa, Daryoosh Dideban, Hadi Heidari. Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters. IEEE Access, 9:65340-65345, 2021. [doi]
@article{JooypaDH21,
title = {Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters},
author = {Hamed Jooypa and Daryoosh Dideban and Hadi Heidari},
year = {2021},
doi = {10.1109/ACCESS.2021.3076202},
url = {https://doi.org/10.1109/ACCESS.2021.3076202},
researchr = {https://researchr.org/publication/JooypaDH21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {65340-65345},
}