Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters

Hamed Jooypa, Daryoosh Dideban, Hadi Heidari. Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters. IEEE Access, 9:65340-65345, 2021. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.