Arun A. Joseph, Hans G. Kerkhoff. Towards Structural Testing of Superconductor Electronics. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1182-1191, IEEE Computer Society, 2003. [doi]
@inproceedings{JosephK03, title = {Towards Structural Testing of Superconductor Electronics}, author = {Arun A. Joseph and Hans G. Kerkhoff}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631182abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/JosephK03}, cites = {0}, citedby = {0}, pages = {1182-1191}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }