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Towards Structural Testing of Superconductor Electronics

Arun A. Joseph, Hans G. Kerkhoff. Towards Structural Testing of Superconductor Electronics. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 1182-1191, IEEE Computer Society, 2003. [doi]

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