Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen. A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{JoshiLYCBLSC19,
title = {A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates},
author = {Kaustubh Joshi and Yung-Huei Lee and Yu-Cheng Yao and Shu-Wen Chang and Siao-Syong Bian and P. J. Liao and Jiaw-Ren Shih and Min-Jan Chen},
year = {2019},
doi = {10.1109/IRPS.2019.8720424},
url = {https://doi.org/10.1109/IRPS.2019.8720424},
researchr = {https://researchr.org/publication/JoshiLYCBLSC19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}