Hessamoddin Jouybari-Moghaddam, Tarlochan S. Sidhu. A study of capacitor element failures in high voltage Shunt Capacitor Banks. In 30th IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2017, Windsor, ON, Canada, April 30 - May 3, 2017. pages 1-4, IEEE, 2017. [doi]
Abstract is missing.