Frequent Pattern Discovery from OWL DLP Knowledge Bases

Joanna Józefowska, Agnieszka Lawrynowicz, Tomasz Lukaszewski. Frequent Pattern Discovery from OWL DLP Knowledge Bases. In Steffen Staab, Vojtech Svátek, editors, Managing Knowledge in a World of Networks, 15th International Conference, EKAW 2006, Podebrady, Czech Republic, October 2-6, 2006, Proceedings. Volume 4248 of Lecture Notes in Computer Science, pages 287-302, Springer, 2006. [doi]

Abstract

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