L. E. Seixas Jr, S. Finco, S. P. Gimenez. VI-Based Measurement System Focusing on Space Applications. J. Electronic Testing, 33(2):267-274, 2017. [doi]
@article{JrFG17,
title = {VI-Based Measurement System Focusing on Space Applications},
author = {L. E. Seixas Jr and S. Finco and S. P. Gimenez},
year = {2017},
doi = {10.1007/s10836-017-5651-3},
url = {http://dx.doi.org/10.1007/s10836-017-5651-3},
researchr = {https://researchr.org/publication/JrFG17},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {33},
number = {2},
pages = {267-274},
}