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Bridging the Gap between Naive Bayes and Maximum Entropy Text Classification

Alfons Juan, David Vilar, Hermann Ney. Bridging the Gap between Naive Bayes and Maximum Entropy Text Classification. In Ana L. N. Fred, Anil K. Jain, editors, Pattern Recognition in Information Systems, Proceedings of the 7th International Workshop on Pattern Recognition in Information Systems, PRIS 2007, In conjunction with ICEIS 2007, Funchal, Madeira, Portugal, June 2007. pages 59-65, INSTICC PRESS, 2007.

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