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Machine learning-based defect prediction model using multilayer perceptron algorithm for escalating the reliability of the software

Sapna Juneja, Ali Nauman, Mudita Uppal, Deepali Gupta, Roobaea Alroobaea, Bahodir Muminov, Yuning Tao. Machine learning-based defect prediction model using multilayer perceptron algorithm for escalating the reliability of the software. The Journal of Supercomputing, 80(7):10122-10147, May 2024. [doi]

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