Hak-Kee Jung. The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping Distribution. J. Inform. and Commun. Convergence Engineering, 10(2):200-204, 2012. [doi]
@article{Jung12a-1,
title = {The Analysis of Breakdown Voltage for the Double-gate MOSFET Using the Gaussian Doping Distribution},
author = {Hak-Kee Jung},
year = {2012},
doi = {10.6109/jicce.2012.10.2.200},
url = {http://dx.doi.org/10.6109/jicce.2012.10.2.200},
researchr = {https://researchr.org/publication/Jung12a-1},
cites = {0},
citedby = {0},
journal = {J. Inform. and Commun. Convergence Engineering},
volume = {10},
number = {2},
pages = {200-204},
}