Jeageun Jung, Mattan Erez. Predicting Future-System Reliability with a Component-Level DRAM Fault Model. In Proceedings of the 56th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2023, Toronto, ON, Canada, 28 October 2023 - 1 November 2023. pages 944-956, ACM, 2023. [doi]
Abstract is missing.