Dong-Hoon Jung, Tae-Hwang Kong, Jun Hyeok Yang, Sangho Kim, Kwangho Kim, Jeongpyo Park, Michael Choi, Jongshin Shin. 29.6 A Distributed Digital LDO with Time-Multiplexing Calibration Loop Achieving 40A/mm2 Current Density and 1mA-to-6.4A Ultra-Wide Load Range in 5nm FinFET CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021. pages 414-416, IEEE, 2021. [doi]
@inproceedings{JungKYKKPCS21,
title = {29.6 A Distributed Digital LDO with Time-Multiplexing Calibration Loop Achieving 40A/mm2 Current Density and 1mA-to-6.4A Ultra-Wide Load Range in 5nm FinFET CMOS},
author = {Dong-Hoon Jung and Tae-Hwang Kong and Jun Hyeok Yang and Sangho Kim and Kwangho Kim and Jeongpyo Park and Michael Choi and Jongshin Shin},
year = {2021},
doi = {10.1109/ISSCC42613.2021.9365964},
url = {https://doi.org/10.1109/ISSCC42613.2021.9365964},
researchr = {https://researchr.org/publication/JungKYKKPCS21},
cites = {0},
citedby = {0},
pages = {414-416},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9549-0},
}