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Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability

Minchae Jung, Walid Saad, Young Rok Jang, Gyuyeol Kong, Sooyong Choi. Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability. IEEE Wireless Commun. Letters, 8(6):1662-1666, 2019. [doi]

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Minchae Jung

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Walid Saad

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Young Rok Jang

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Gyuyeol Kong

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Sooyong Choi

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