Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability

Minchae Jung, Walid Saad, Young Rok Jang, Gyuyeol Kong, Sooyong Choi. Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability. IEEE Wireless Commun. Letters, 8(6):1662-1666, 2019. [doi]

Abstract

Abstract is missing.