Complex Adaptive Signal Processing for Analog Testing

Adão Antonio de Souza Junior, Marcelo Negreiros, Luigi Carro, Altamiro A. Suzim. Complex Adaptive Signal Processing for Analog Testing. In 3rd Latin American Test Workshop, LATW 2002, Montevideo, Uruguay, February 10-13, 2002. pages 166-173, IEEE, 2002.

@inproceedings{JuniorNCS02,
  title = {Complex Adaptive Signal Processing for Analog Testing},
  author = {Adão Antonio de Souza Junior and Marcelo Negreiros and Luigi Carro and Altamiro A. Suzim},
  year = {2002},
  researchr = {https://researchr.org/publication/JuniorNCS02},
  cites = {0},
  citedby = {0},
  pages = {166-173},
  booktitle = {3rd Latin American Test Workshop, LATW 2002, Montevideo, Uruguay, February 10-13, 2002},
  publisher = {IEEE},
}