Pilin Junsangsri, Fabrizio Lombardi. Time/Temperature Degradation of Solar Cells under the Single Diode Model. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 240-248, IEEE Computer Society, 2010. [doi]
@inproceedings{JunsangsriL10,
title = {Time/Temperature Degradation of Solar Cells under the Single Diode Model},
author = {Pilin Junsangsri and Fabrizio Lombardi},
year = {2010},
doi = {10.1109/DFT.2010.36},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2010.36},
researchr = {https://researchr.org/publication/JunsangsriL10},
cites = {0},
citedby = {0},
pages = {240-248},
booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-8447-8},
}