Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs

Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs. Microprocessors and Microsystems, 77:103117, 2020. [doi]

Authors

Lembit Jürimägi

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Raimund Ubar

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Maksim Jenihhin

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Jaan Raik

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