Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs. Microprocessors and Microsystems, 77:103117, 2020. [doi]
@article{JurimagiUJR20,
title = {Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs},
author = {Lembit Jürimägi and Raimund Ubar and Maksim Jenihhin and Jaan Raik},
year = {2020},
doi = {10.1016/j.micpro.2020.103117},
url = {https://doi.org/10.1016/j.micpro.2020.103117},
researchr = {https://researchr.org/publication/JurimagiUJR20},
cites = {0},
citedby = {0},
journal = {Microprocessors and Microsystems},
volume = {77},
pages = {103117},
}