Sudeendra Kumar K, Saurabh Seth, Sauvagya Ranjan Sahoo, Abhishek Mahapatra, Ayas Kanta Swain, Kamalakanta Mahapatra. PUF-Based Secure Test Wrapper for SoC Testing. In 2018 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2018, Hong Kong, China, July 8-11, 2018. pages 672-677, IEEE Computer Society, 2018. [doi]
Abstract is missing.