A. Kablanian. Embedded Memory Test and Repair. In 10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France. IEEE Computer Society, 2002.
@inproceedings{Kablanian02,
title = {Embedded Memory Test and Repair},
author = {A. Kablanian},
year = {2002},
tags = {testing},
researchr = {https://researchr.org/publication/Kablanian02},
cites = {0},
citedby = {0},
booktitle = {10th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2002), 10-12 July 2002, Isle of Bendor, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-1617-3},
}