Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, V. Putcha, Erik Bury, Marco Simicic, A. Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, G. Rzepa, Michael Waltl, Tibor Grasser. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. Microelectronics Reliability, 81:186-194, 2018. [doi]
Abstract is missing.