Gurunath Kadam, Markus Rudack, Krishnendu Chakrabarty, Juergen Alt. Supply-voltage optimization to account for process variations in high-volume manufacturing testing. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-9, IEEE, 2016. [doi]
Abstract is missing.