Fine-grained fault tolerance using device checkpoints

Asim Kadav, Matthew J. Renzelmann, Michael M. Swift. Fine-grained fault tolerance using device checkpoints. In Vivek Sarkar, Rastislav Bodík, editors, Architectural Support for Programming Languages and Operating Systems, ASPLOS '13, Houston, TX, USA - March 16 - 20, 2013. pages 473-484, ACM, 2013. [doi]

Abstract

Abstract is missing.