VLSI: An investigation into electromagnetic signatures (EMS) for non-invasive testing and signal-integrity verification

H. J. Kadim, Lacina M. Coulibaly. VLSI: An investigation into electromagnetic signatures (EMS) for non-invasive testing and signal-integrity verification. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-4, IEEE, 2013. [doi]

@inproceedings{KadimC13,
  title = {VLSI: An investigation into electromagnetic signatures (EMS) for non-invasive testing and signal-integrity verification},
  author = {H. J. Kadim and Lacina M. Coulibaly},
  year = {2013},
  doi = {10.1109/EWDTS.2013.6673146},
  url = {http://dx.doi.org/10.1109/EWDTS.2013.6673146},
  researchr = {https://researchr.org/publication/KadimC13},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013},
  publisher = {IEEE},
}