Andrew Kae, Gary B. Huang, Carl Doersch, Eerk G. Learned-Miller. Improving state-of-the-art OCR through high-precision document-specific modeling. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 1935-1942, IEEE, 2010. [doi]
Abstract is missing.