Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar. On-Chip Test Embedding for Multi-Weighted Random LFSRs. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 135, IEEE Computer Society, 1998. [doi]
@inproceedings{KagarisTM98,
title = {On-Chip Test Embedding for Multi-Weighted Random LFSRs},
author = {Dimitrios Kagaris and Spyros Tragoudas and Amitava Majumdar},
year = {1998},
url = {http://computer.org/proceedings/dft/8832/88320135abs.htm},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/KagarisTM98},
cites = {0},
citedby = {0},
pages = {135},
booktitle = {13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-8186-8832-7},
}