Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar. On-Chip Test Embedding for Multi-Weighted Random LFSRs. In 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 98), 2-4 November 1998, Austin, TX, USA, Proceedings. pages 135, IEEE Computer Society, 1998. [doi]
Abstract is missing.