Toward Holistic Modeling, Margining and Tolerance of IC Variability

Andrew B. Kahng. Toward Holistic Modeling, Margining and Tolerance of IC Variability. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2014, Tampa, FL, USA, July 9-11, 2014. pages 284-289, IEEE, 2014. [doi]

Authors

Andrew B. Kahng

This author has not been identified. Look up 'Andrew B. Kahng' in Google