Enhanced metamodeling techniques for high-dimensional IC design estimation problems

Andrew B. Kahng, Bill Lin, Siddhartha Nath. Enhanced metamodeling techniques for high-dimensional IC design estimation problems. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1861-1866, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

@inproceedings{KahngLN13,
  title = {Enhanced metamodeling techniques for high-dimensional IC design estimation problems},
  author = {Andrew B. Kahng and Bill Lin and Siddhartha Nath},
  year = {2013},
  url = {http://dl.acm.org/citation.cfm?id=2485726},
  researchr = {https://researchr.org/publication/KahngLN13},
  cites = {0},
  citedby = {0},
  pages = {1861-1866},
  booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
  editor = {Enrico Macii},
  publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
  isbn = {978-1-4503-2153-2},
}