Supply Voltage Degradation Aware Analytical Placement

Andrew B. Kahng, Bao Liu, Qinke Wang. Supply Voltage Degradation Aware Analytical Placement. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 437-443, IEEE Computer Society, 2005. [doi]

@inproceedings{KahngLW05,
  title = {Supply Voltage Degradation Aware Analytical Placement},
  author = {Andrew B. Kahng and Bao Liu and Qinke Wang},
  year = {2005},
  doi = {10.1109/ICCD.2005.101},
  url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.101},
  tags = {context-aware},
  researchr = {https://researchr.org/publication/KahngLW05},
  cites = {0},
  citedby = {0},
  pages = {437-443},
  booktitle = {23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2451-6},
}