Andrew B. Kahng, Sherief Reda. New and improved BIST diagnosis methods from combinatorial Group testing theory. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(3):533-543, 2006. [doi]
@article{KahngR06,
title = {New and improved BIST diagnosis methods from combinatorial Group testing theory},
author = {Andrew B. Kahng and Sherief Reda},
year = {2006},
doi = {10.1109/TCAD.2005.854635},
url = {http://dx.doi.org/10.1109/TCAD.2005.854635},
tags = {testing},
researchr = {https://researchr.org/publication/KahngR06},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {3},
pages = {533-543},
}