A Genetic Algorithm-Based Metaheuristic Approach for Test Cost Optimization of 3D SIC

Tanusree Kaibartta, G. P. Biswas, Arup Kumar Pal, Debesh Kumar Das. A Genetic Algorithm-Based Metaheuristic Approach for Test Cost Optimization of 3D SIC. IEEE Access, 9:160987-161002, 2021. [doi]

Abstract

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