Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita. Stuck-open faults test generation for cmos combinational circuits. Systems and Computers in Japan, 22(9):33-42, 1991. [doi]
@article{KajiharaIK91,
title = {Stuck-open faults test generation for cmos combinational circuits},
author = {Seiji Kajihara and Noriyoshi Itazaki and Kozo Kinoshita},
year = {1991},
doi = {10.1002/scj.4690220904},
url = {http://dx.doi.org/10.1002/scj.4690220904},
researchr = {https://researchr.org/publication/KajiharaIK91},
cites = {0},
citedby = {0},
journal = {Systems and Computers in Japan},
volume = {22},
number = {9},
pages = {33-42},
}