Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita. Stuck-open faults test generation for cmos combinational circuits. Systems and Computers in Japan, 22(9):33-42, 1991. [doi]
Abstract is missing.