Seiji Kajihara, Yousuke Miyake, Yasuo Sato, Yukiya Miura. An On-Chip Digital Environment Monitor for Field Test. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 254-257, IEEE Computer Society, 2014. [doi]
@inproceedings{KajiharaMSM14, title = {An On-Chip Digital Environment Monitor for Field Test}, author = {Seiji Kajihara and Yousuke Miyake and Yasuo Sato and Yukiya Miura}, year = {2014}, doi = {10.1109/ATS.2014.54}, url = {http://dx.doi.org/10.1109/ATS.2014.54}, researchr = {https://researchr.org/publication/KajiharaMSM14}, cites = {0}, citedby = {0}, pages = {254-257}, booktitle = {23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014}, publisher = {IEEE Computer Society}, isbn = {978-1-4799-6030-9}, }