T/R Switch Composed of Three HV-MOSFETs With 12.1-μW Consumption That Enables Per-Channel Self-Loopback AC Tests and -18.1-dB Switching Noise Suppression for 3-D Ultrasound Imaging With 3072-Ch Transceiver

Shinya Kajiyama, Yutaka Igarashi, Toru Yazaki, Yusaku Katsube, Takuma Nishimoto, Tatsuo Nakagawa, Yohei Nakamura, Yoshihiro Hayashi, Takuya Kaneko, Hiroki Ishikuro, Taizo Yamawaki. T/R Switch Composed of Three HV-MOSFETs With 12.1-μW Consumption That Enables Per-Channel Self-Loopback AC Tests and -18.1-dB Switching Noise Suppression for 3-D Ultrasound Imaging With 3072-Ch Transceiver. IEEE Trans. VLSI Syst., 30(2):153-165, 2022. [doi]

@article{KajiyamaIYKNNNH22,
  title = {T/R Switch Composed of Three HV-MOSFETs With 12.1-μW Consumption That Enables Per-Channel Self-Loopback AC Tests and -18.1-dB Switching Noise Suppression for 3-D Ultrasound Imaging With 3072-Ch Transceiver},
  author = {Shinya Kajiyama and Yutaka Igarashi and Toru Yazaki and Yusaku Katsube and Takuma Nishimoto and Tatsuo Nakagawa and Yohei Nakamura and Yoshihiro Hayashi and Takuya Kaneko and Hiroki Ishikuro and Taizo Yamawaki},
  year = {2022},
  doi = {10.1109/TVLSI.2021.3129313},
  url = {https://doi.org/10.1109/TVLSI.2021.3129313},
  researchr = {https://researchr.org/publication/KajiyamaIYKNNNH22},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {30},
  number = {2},
  pages = {153-165},
}