Yoshiki Kakuta, Reika Kinoshita, Hiroshi Kinoshita, Chihiro Matsui, Ken Takeuchi. Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers. In 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{KakutaKKMT20, title = {Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers}, author = {Yoshiki Kakuta and Reika Kinoshita and Hiroshi Kinoshita and Chihiro Matsui and Ken Takeuchi}, year = {2020}, doi = {10.1109/VLSI-DAT49148.2020.9196379}, url = {https://doi.org/10.1109/VLSI-DAT49148.2020.9196379}, researchr = {https://researchr.org/publication/KakutaKKMT20}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020}, publisher = {IEEE}, isbn = {978-1-7281-6083-2}, }